首页> 外国专利> METHOD AND DEVICE FOR INSPECTING MAGNETIC CHARACTERISTICS, AND FIXTURES FOR CLEANING OR FOR INSPECTING CONTACT PROBE UNIT

METHOD AND DEVICE FOR INSPECTING MAGNETIC CHARACTERISTICS, AND FIXTURES FOR CLEANING OR FOR INSPECTING CONTACT PROBE UNIT

机译:用于检验磁性特征的方法和装置,以及用于清洁或检验接触式探针单元的夹具

摘要

PROBLEM TO BE SOLVED: To provide a method and a device for inspecting magnetic characteristics, capable of automating cleaning of a contact probe unit and improving the inspection reliability and the throughput of a magnetic head and a magnetic disk.;SOLUTION: By having a cleaning dummy head assembly disposed and clamped on a head clamp base, in place of a magnetic head assembly and bring a contact probe unit into contact with a cleaning part, e.g., a cleaning sheet, without having manual work with the contact terminal of the contact probe unit, the contact probe unit is cleaned by contact operation.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种用于检查磁性的方法和装置,其能够自动清洁接触式探针单元并提高检查可靠性以及磁头和磁盘的吞吐量。代替磁头组件,将虚拟头组件放置并固定在头夹基座上,并使接触探针单元与清洁部件(例如,清洁纸)接触,而无需手动操作接触探针的接触端子单元;通过接触操作清洁接触探针单元。;版权所有:(C)2009,JPO&INPIT

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