首页> 外国专利> DEVICE STRUCTURES FOR ACTIVE DEVICES FABRICATED USING A SEMICONDUCTOR-ON-INSULATOR SUBSTRATE AND DESIGN STRUCTURES FOR A RADIOFREQUENCY INTEGRATED CIRCUIT

DEVICE STRUCTURES FOR ACTIVE DEVICES FABRICATED USING A SEMICONDUCTOR-ON-INSULATOR SUBSTRATE AND DESIGN STRUCTURES FOR A RADIOFREQUENCY INTEGRATED CIRCUIT

机译:使用绝缘体上半导体衬底制造有源器件的装置结构和射频集成电路的设计结构

摘要

Device structure for active devices fabricated in a semiconductor-on-insulator (SOI) substrate and design structures for a radiofrequency integrated circuit. The device structure includes a first isolation region in the semiconductor layer that extends from a top surface of a semiconductor layer to a first depth, a second isolation region in the semiconductor layer that extends from the top surface of the semiconductor layer to a second depth greater than the first depth, and a first doped region in the semiconductor layer. The first doped region is disposed vertically between the first isolation region and an insulating layer disposed between the semiconductor layer and a handle wafer of the SOI substrate. The device structure may be included in a design structure embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit.
机译:在绝缘体上半导体(SOI)衬底中制造的有源器件的器件结构和射频集成电路的设计结构。器件结构包括在半导体层中从半导体层的顶表面延伸到第一深度的第一隔离区域,在半导体层中从半导体层的顶表面延伸到第二深度更大的第二隔离区域。半导体层中的第一掺杂区的厚度大于第一深度。第一掺杂区垂直设置在第一隔离区和绝缘层之间,该绝缘层设置在半导体层和SOI衬底的操作晶片之间。装置结构可以包括在体现在机器可读介质中的设计结构中,用于设计,制造或测试集成电路。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号