首页>
外国专利>
TECHNIQUES FOR CHARACTERIZING PERFORMANCE OF TRANSISTORS IN INTEGRATED CIRCUIT DEVICES
TECHNIQUES FOR CHARACTERIZING PERFORMANCE OF TRANSISTORS IN INTEGRATED CIRCUIT DEVICES
展开▼
机译:集成电路器件中的晶体管性能表征技术
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method, system and computer program product for characterizing FET transistors in an electronic circuit (IC) device using Performance Screen Ring Oscillator (PSRO) techniques. During PSRO testing, logic and non-logic bias voltages are applied to gate terminals of the being tested FETs to determine process-related variations and the relative strength of N-type and P-type transistors.
展开▼