High/Low-Temperature Contactless RF Probes for Characterizing Microwave Integrated Circuits and Devices

摘要

Low-temperature, contactless radio-frequency (RF) probing systems are necessary for characterizing sensors operating at liquid nitrogen or helium temperatures, and based on superconducting materials. The design and operation of the contactless RF probing systems relies on strong electromagnetic coupling that takes place between two different microwave transmission lines oriented in close proximity, but not in contact with each other, to ensure high thermal isolation. The goal of this work is to develop a reliable, easily constructed, less expensive, contactless RF probe for characterizing microwave integrated circuits (MICs) and devices embedded in sensors fabricated on conformal or non-planar substrates, at elevated or cryogenic temperatures.