Testing for normal or reverse temperature related delay variations in integrated circuits

摘要

A method for determining that a circuit is operating in the reverse temperature dependence domain includes creating baseline delay information, detecting a temperature change with one or more temperature sensors, after detecting the temperature change, creating current delay information, comparing the baseline delay information with the current delay information, determining that the temperature change was a positive change; determining that the current delay information indicates that the circuit is operating faster when the baseline delay information was taken.