首页> 外国专利> METHOD OF MAKING AN OHMIC CONTACT TO P-TYPE SILICON CARBIDE, COMPRISING TITANIUM CARBIDE AND NICKEL SILICIDE

METHOD OF MAKING AN OHMIC CONTACT TO P-TYPE SILICON CARBIDE, COMPRISING TITANIUM CARBIDE AND NICKEL SILICIDE

机译:由P型碳化硅和碳化硅镍构成欧姆接触的方法

摘要

A method of producing an ohmic contact to p-type silicon carbide comprising two layers, the first one comprising nickel silicide and the second one comprising titanium carbide is disclosed. The deposited layers are annealed to convert at least a part of deposited metals to nickel silicide and titanium carbide. The contact is formed by reaction between the metals and the semiconductor, and thus the in-situ simultaneous formation of metal silicide and carbide suppress the release of excess carbon at the contact interface. Noble metals may be deposited preferably in between titanium and nickel to improve the contact morphology.
机译:公开了一种制造与包括两层的p型碳化硅的欧姆接触的方法,第一层包括硅化镍,第二层包括碳化钛。对沉积的层进行退火,以将至少一部分沉积的金属转化为硅化镍和碳化钛。通过金属与半导体之间的反应形成接触,因此金属硅化物和碳化物的原位同时形成抑制了接触界面处过量碳的释放。贵金属可以优选沉积在钛和镍之间以改善接触形态。

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