首页> 外国专利> METHOD FOR GROWING GALLIUM NITRIDE CRYSTAL, GALLIUM NITRIDE CRYSTAL SUBSTRATE, METHOD FOR PRODUCING EPITAXIAL WAFER, AND EPITAXIAL WAFER

METHOD FOR GROWING GALLIUM NITRIDE CRYSTAL, GALLIUM NITRIDE CRYSTAL SUBSTRATE, METHOD FOR PRODUCING EPITAXIAL WAFER, AND EPITAXIAL WAFER

机译:氮化镓晶体,氮化镓晶体基质的生长方法,表观晶片的生产方法和表观晶片

摘要

PROBLEM TO BE SOLVED: To provide a method for growing a gallium nitride crystal suppressing cracks generating upon processing for thinning, and allowing to grow a gallium nitride crystal with greater thickness; a gallium nitride crystal substrate, an epitaxial wafer, and a method for producing the epitaxial wafer.;SOLUTION: The method for growing a gallium nitride crystal to grow the gallium nitride crystal on a ground substrate by means of the hydride vapor phase epitaxy (HVPE) using a carrier gas, raw materials of gallium nitride and a gas including silicon as a dopant is characterized in that the carrier gas is purified by permeating the gas through a molecular membrane or an adsorbent during the growth of the gallium nitride crystal, and the dew point of the carrier gas during the growth of the gallium nitride crystal is -60°C or lower.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种生长氮化镓晶体的方法,该方法抑制在进行减薄处理时产生的裂纹,并允许生长厚度更大的氮化镓晶体。氮化镓晶体衬底,外延晶片以及外延晶片的制造方法;解决方案:利用氢化物气相外延(HVPE)生长氮化镓晶体以在接地衬底上生长氮化镓晶体的方法)使用载气,氮化镓的原料和包含硅作为掺杂剂的气体的特征在于,通过在氮化镓晶体的生长过程中使气体透过分子膜或吸附剂来净化载气,并且氮化镓晶体生长过程中载气的露点为-60°C或更低。; COPYRIGHT:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010215501A

    专利类型

  • 公开/公告日2010-09-30

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP20100105196

  • 发明设计人 FUJITA SHUNSUKE;

    申请日2010-04-30

  • 分类号C30B29/38;H01L21/205;C30B25/14;C23C16/34;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:08

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