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MULTI-GRADATION PHOTOMASK, METHOD FOR MANUFACTURING MULTI-GRADATION PHOTOMASK AND PATTERN TRANSFER METHOD

机译:多层光掩模,制造多层光掩模的方法和图案转移方法

摘要

PPROBLEM TO BE SOLVED: To provide a multi-gradation photomask wherein a defect generated in a translucent part made of a translucent film is suitably corrected. PSOLUTION: The multi-gradation photomask has a transfer pattern having a light shielding part, a light transmitting part and a light translucent part formed on a transparent substrate, and forms a resist pattern having two or more different resist residual film values on a resist film on a body to be transferred. In the multi-gradation photomask, the light shielding part is formed by forming a light shielding film on the transparent substrate, the light transmitting part is formed by exposing the transparent substrate, the translucent part has a normal part made of the translucent film formed on the transparent substrate and a correction part made of a correction film formed on the transparent substrate, and has a phase difference with respect to wavelength light i-line to g-line in the light transmitting part and the correction part of 80 or below. PCOPYRIGHT: (C)2010,JPO&INPIT
机译:

要解决的问题:提供一种多灰度级光掩模,其中可以适当地校正由半透明膜制成的半透明部分中产生的缺陷。

解决方案:所述多灰度级光掩模具有在透明基板上形成的具有遮光部,透光部和透光部的转印图案,并在其上形成具有两个或多个不同的抗蚀剂残留膜值的抗蚀剂图案。待转印物体上的抗蚀剂膜。在多灰度级光掩模中,遮光部是通过在透明基板上形成遮光膜而形成的,透光部是通过使透明基板曝光而形成的,透光部具有由透光膜形成的法线部。透明基板和形成在透明基板上的由校正膜制成的校正部,并且在透光部和校正部中,相对于波长线i线至g线的相位差为80以下。

版权:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010198006A

    专利类型

  • 公开/公告日2010-09-09

    原文格式PDF

  • 申请/专利权人 HOYA CORP;

    申请/专利号JP20100013914

  • 发明设计人 SAKAMOTO YUJI;

    申请日2010-01-26

  • 分类号G03F1/08;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:44

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