首页> 外国专利> MULTI-GRADATION PHOTOMASK, PHOTOMASK BLANK, METHOD FOR MANUFACTURING MULTI-GRADATION PHOTOMASK, AND PATTERN TRANSFER METHOD

MULTI-GRADATION PHOTOMASK, PHOTOMASK BLANK, METHOD FOR MANUFACTURING MULTI-GRADATION PHOTOMASK, AND PATTERN TRANSFER METHOD

机译:多层光掩膜,光掩膜空白,制造多层光掩膜的方法和图案转移方法

摘要

PPROBLEM TO BE SOLVED: To uniformize an etching rate within a plane of a light-shielding film regardless of the figure of a transfer pattern, to improve the quality of a multi-gradation photomask, and to improve the production yield. PSOLUTION: The multi-gradation photomask has a predetermined transfer pattern including a light-shielding part, a light-transmitting part and a translucent part formed on a transparent substrate, wherein the light-shielding part comprises an etching balancer film having conductivity, a translucent film and a light-shielding film layered in this order on the transparent substrate, the translucent part comprises the etching balancer film and the translucent film layered in this order on the transparent substrate, and the light-transmitting part comprises an exposed part of the transparent substrate. PCOPYRIGHT: (C)2011,JPO&INPIT
机译:

要解决的问题:无论转印图案的形状如何,均化在遮光膜的平面内的蚀刻速率,提高多级光掩模的质量,并提高生产率。

解决方案:所述多灰度级光掩模具有预定的转印图案,所述预定的转印图案包括在透明基板上形成的遮光部,透光部和半透明部,其中所述遮光部包括具有导电性的蚀刻平衡膜。在透明基板上依次层叠有透光膜和遮光膜,透光部包括在透明基板上依次层叠的蚀刻平衡膜和透光膜,透光部包括露出部。透明基板的厚度。

版权:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011048353A

    专利类型

  • 公开/公告日2011-03-10

    原文格式PDF

  • 申请/专利权人 HOYA CORP;

    申请/专利号JP20100168385

  • 发明设计人 YOSHIKAWA YUTAKA;FUKUMOTO TOMONORI;

    申请日2010-07-27

  • 分类号G03F1/08;G02F1/1368;H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-21 18:22:10

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