首页> 外国专利> PLASMA PROCESSING METHOD, PLASMA PROCESSING APPARATUS, AND MOISTURE CONTENT DETECTING METHOD OF PLASMA PROCESSING APPARATUS

PLASMA PROCESSING METHOD, PLASMA PROCESSING APPARATUS, AND MOISTURE CONTENT DETECTING METHOD OF PLASMA PROCESSING APPARATUS

机译:等离子处理方法,等离子处理设备以及等离子处理设备的水分含量检测方法

摘要

PROBLEM TO BE SOLVED: To detect a moisture content in a processing chamber without using a mass spectrometer such as a quadrupole type mass spectrometer (Qmass).;SOLUTION: A plasma processing method includes a step of reducing the pressure in the processing chamber 110 and introducing a prescribed gas while evacuating the processing chamber, and exciting the gas to a plasma, a step of acquiring light emission intensity by receiving light in a specified wavelength range correlative to the moisture content in the processing chamber in a light emission spectrum of the plasma transmitted through a window portion 200 for monitoring provided to the processing chamber, and a step of detecting change in moisture content in the processing chamber on the basis of the light emission intensity.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:在不使用诸如四极型质谱仪(Qmass)之类的质谱仪的情况下检测处理室中的水分含量;解决方案:等离子体处理方法包括以下步骤:降低处理室110中的压力;以及在排空处理腔室的同时引入规定的气体,并将其激发到等离子体,这是通过接收与等离子体的发光光谱中与处理腔室中的水分含量相关的指定波长范围的光来获取发光强度的步骤透过设置在处理室中的用于监视的窗口部分200进行透射,以及基于发光强度检测处理室中水分含量变化的步骤。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010147052A

    专利类型

  • 公开/公告日2010-07-01

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;

    申请/专利号JP20080319381

  • 申请日2008-12-16

  • 分类号H01L21/3065;H05H1/00;H05H1/46;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:30

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号