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EVALUATION METHOD AND EVALUATING DEVICE OF THIN FILM ADHESION STRENGTH

机译:薄膜附着力的评价方法及评价装置

摘要

PROBLEM TO BE SOLVED: To provide a thin film adhesion strength evaluation method and an evaluation device capable of evaluating qualitatively and quantitatively thin film adhesion strength, which has been difficult to be evaluated by a conventional method.;SOLUTION: This thin film adhesion strength evaluation method has processes for: applying ultrasonic vibration by allowing an ultrasonic vibration needle to abut on an edge part or its periphery in the face direction of the thin film formed on a substrate; detecting generation of exfoliation at the edge part of the thin film after application of the ultrasonic vibration; and evaluating thin film adhesion strength onto the substrate by a generation amount of exfoliation.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种能够定性和定量地评估薄膜粘合强度的薄膜粘合强度评估方法和评估装置,而这是常规方法难以评估的。该方法具有以下步骤:通过使超声振动针沿在基板上形成的薄膜的面方向上的边缘部分或其周边抵接来施加超声振动;在施加超声波振动后,检测薄膜的边缘部分的剥离产生;并通过产生的剥落量评估薄膜在基材上的附着力。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2009288145A

    专利类型

  • 公开/公告日2009-12-10

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20080142504

  • 申请日2008-05-30

  • 分类号G01N19/04;

  • 国家 JP

  • 入库时间 2022-08-21 19:01:51

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