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Refractive index measurement tools, refractive index measurement device and refractive index measurement method

机译:折射率测量工具,折射率测量装置和折射率测量方法

摘要

PROBLEM TO BE SOLVED: To provide a refractive index measuring appliance capable of measuring the refractive index of a sample large in absorption coefficient with high precision, a refractive index measuring instrument using the refractive index measuring appliance and a refractive index measuring method.;SOLUTION: The refractive index measuring appliance has a housing part S0 for housing the sample, an outside incident surface S1 on which light L enters from outside, an inside emitting surface S2 for emitting the light L, which is incident from the outside incident surface S1, to the housing part S0, an inside incident surface S3 receiving the incidence of the light L emitted from the inside emitting surface S2 to pass through the housing part S0 and an outside emitting surface S4 for emitting the light L, which is incident from the inside incident surface S3, to the outside and satisfies at least one of the mutually non-parallel relation of the outside incident surface S1 and the inside emitting surface S2 and the mutually non-parallel relation of the inside incident surface S3 and the outside emitting surface S4.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种能够高精度地测量吸收系数大的样品的折射率的折射率测量仪,使用该折射率测量仪的折射率测量仪和折射率测量方法。折射率测量仪具有用于容纳样品的容纳部S0,从外部入射光L的外部入射表面S1,从外部入射表面S1入射的用于发射光L的内部发射表面S2。壳体部分S0,内部入射表面S3,其接收从内部发射表面S2发射的光L的入射以穿过壳体部分S0,以及外部发射表面S4,用于发射从内部入射的入射的光L表面S3向外侧,并且满足外部入射表面S1和ins的相互不平行的关系中的至少一种出射面S2以及内入射面S3和出射面S4相互不平行的关系。;版权:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP4538364B2

    专利类型

  • 公开/公告日2010-09-08

    原文格式PDF

  • 申请/专利权人 株式会社オハラ;

    申请/专利号JP20050120177

  • 发明设计人 大門 昌彦;

    申请日2005-04-18

  • 分类号G01N21/41;G01N21/03;

  • 国家 JP

  • 入库时间 2022-08-21 18:58:50

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