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首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >Refraction in plane-parallel plate - Reconsideration of method of measurement of refractive indices
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Refraction in plane-parallel plate - Reconsideration of method of measurement of refractive indices

机译:平面平行板中的折射-折射率测量方法的反思

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The prism (minimum deviation) method of measurement of refractive indices in solids has a couple of disadvantages including problems associated with manufacturing of a good prism itself. Besides this method is unsuitable to be used in piezo- and electro-optical experiments when one needs to achieve so-called homogeneous distribution of an interaction (electric field, stress, strain) within the sample. Besides, worked out with a large expenditure of energy and cost, the prism is usually useless in other applications (destructive method). Therefore, an "elder" method of measurement of refractive indices by measuring shift of the refracted beam of light in a plane-parallel plate has been reconsidered in this paper. The sample itself may be a cuboid (if one wishes to measure all of three principal refractive indices in optically biaxial crystal), or just a crystalline boule in which one is cutting off the conical and tail parts and by suitable mechanical treatment (lapping and polishing) reveals a pair of plane parallel surfaces properly oriented to crystallographic (or principal axes of the optical indicatrix) directions. In such case, however, one can only measure one (isotropic crystals) or two (optically uniaxial crystals) refractive indices. However, in case of this method as opposed to the prism method one can repeat the measurement a couple of times, e.g. after a series of consecutive annealing, when this is either impossible or undesirable to cut the boule into smaller pieces prior to the final annealing (nondestructive method). The error depends on the angle of incidence and on sample (boule) thickness and is usually of the order of 0.001. However, in the future it is expected that the error can be reduced by implementing an electronic readout of the beam shift below 1 μm. Working of the method has been illustrated with a couple of examples in GdCOB (biaxial), LiNbO_3 (uniaxial) and YAG:Cr,Mg (isotropic) crystals.
机译:测量固体中折射率的棱镜(最小偏差)方法有两个缺点,包括与制造好棱镜本身有关的问题。此外,当需要在样品内实现相互作用(电场,应力,应变)的所谓均匀分布时,该方法不适用于压电和光电实验。此外,由于耗费大量能源和成本进行计算,棱镜通常在其他应用(破坏性方法)中无用。因此,在本文中考虑了通过测量在平行平板中的折射光束的位移来测量折射率的“老年”方法。样品本身可以是长方体(如果希望测量光学双轴晶体中所有三个主折射率),也可以只是晶体晶块,其中一个正在切掉圆锥形和尾部并通过适当的机械处理(研磨和抛光) )揭示了一对正确定向于晶体学(或光学基准的主轴)方向的平面平行表面。但是,在这种情况下,只能测量一个(各向同性晶体)或两个(光学单轴晶体)折射率。但是,与棱镜方法相比,在这种方法的情况下,例如可以重复几次测量。在一系列连续退火之后,如果不可能或不希望在最终退火之前将晶锭切成小块(无损方法)。误差取决于入射角和样品(毛坯)的厚度,通常约为0.001。但是,在将来,可以预期通过实现电子偏移小于1μm的电子读数来减少误差。该方法的工作已在GdCOB(双轴),LiNbO_3(单轴)和YAG:Cr,Mg(各向同性)晶体中用几个示例进行了说明。

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