首页> 外国专利> Method of Forming an Electrical Contact Between a Support Wafer and the Surface of a Top Silicon Layer of a Silicon-on-Insulator Wafer and an Electrical Device Including Such an Electrical Contact

Method of Forming an Electrical Contact Between a Support Wafer and the Surface of a Top Silicon Layer of a Silicon-on-Insulator Wafer and an Electrical Device Including Such an Electrical Contact

机译:在支撑晶片和绝缘体上硅晶片的顶部硅层的表面之间形成电接触的方法以及包括这种电接触的电子设备

摘要

Method of forming an electrical contact between a support wafer and a surface of a top silicon layer of a silicon-on-insulator wafer. The method comprises etching a cavity into the top silicon layer and the insulator layer. A selective epitaxial step is performed for growing an epitaxial layer of silicon inside the cavity up to the surface of the top silicon layer. An electrical device comprising an electrical contact between a support wafer and a surface of a top silicon layer of a silicon-on-insulator wafer formed according to the inventive method.
机译:在支撑晶片和绝缘体上硅晶片的顶部硅层的表面之间形成电接触的方法。该方法包括将空腔蚀刻到顶部硅层和绝缘体层中。进行选择性外延步骤,以在腔体内生长硅的外延层直至顶部硅层的表面。一种电气装置,其包括在支撑晶片和根据本发明的方法形成的绝缘体上硅晶片的顶部硅层的表面之间的电接触。

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