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Simulator and parameter extraction device for transistor, simulation and parameter extraction method for transistor, and associated computer program and storage medium

机译:用于晶体管的仿真器和参数提取装置,用于晶体管的仿真和参数提取方法以及相关的计算机程序和存储介质

摘要

A transistor model for a simulator simulates a resistance between a source region and a drain region with a model equation which has terms representing resistance values corresponding respectively to areas of mutually different impurity concentrations below a gate section in simulating characteristics of a transistor. At least two of the terms each having a threshold parameter indicating a voltage at which a semiconductor element composed of the associated region and regions adjacent to that region changes from an ON state to an OFF state. The threshold parameters of the terms being specified independently from each other. Thus, the characteristics of a transistor having a set of areas of mutually different impurity concentrations below a gate section, inclusive of subthreshold regions which are difficult to evaluate through actual measurement, can be simulated to high accuracy while preserving a good fit with a capacitance model.
机译:用于模拟器的晶体管模型通过模型方程式来模拟源极区域和漏极区域之间的电阻,该模型方程式具有表示在模拟晶体管的特性时分别对应于栅极部分下方的杂质浓度彼此不同的区域的电阻值的项。至少两项中的每一项具有阈值参数,该阈值参数指示由关联区域和与该区域相邻的区域组成的半导体元件从导通状态变为截止状态的电压。术语的阈值参数彼此独立指定。因此,可以在保持与电容模型的良好拟合的同时,高精度地模拟在栅极部以下具有杂质浓度彼此不同的一组区域的晶体管的特性,包括难以通过实际测量进行评估的亚阈值区域。 。

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