PURPOSE: A test contactor is provided to minimize influence of inductance at a test by contacting a lead terminal and a test terminal through a spring pin although a height or a position of the test terminal and the lead terminal is different.;CONSTITUTION: A spring pin(200) is made of one metal wire wound into a spiral shape. One end of the spring pin is contacted with a lead terminal(30). The other one of the spring pin is contacted with a test terminal(50). The spring pin electrically connects the lead terminal to the test terminal. A housing(20) supports the spring pin. A conductive unit is connected from one end to the other end of the spring pin with a linear type, and includes a first conductive path and a second conductive path. The first conductive path includes a winding end connected to one end of the spring pin, and penetrates an inner part of the spring pin. The second conductive path includes a winding end connected to the other end of the spring pin, and penetrates an inner part of the spring pin.;COPYRIGHT KIPO 2010
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