CONNECTING UNIT FOR SEMICONDUCTOR CHIP TEST AND A SEMICONDUCTOR CHIP TEST DEVICE THEREOF, CAPABLE OF PROCEEDING A ELECTRICAL TEST ABOUT SEMICONDUCTOR CHIPS HAVING ELECTRIC CONNECTION TERMINALS OF VARIOUS PATTERNS

摘要

PURPOSE: A connecting unit for semiconductor chip test and a semiconductor chip test device thereof are provided to improve accuracy of an electrical test by connecting cables to electric connection terminals selectively according to patterns of the various electric connection terminals of semiconductor chips and proceeding the test.;CONSTITUTION: A connecting unit for semiconductor chip test(200) has a connector fixation plate(210). A plurality of installation holes(211) of a grid shape is formed in the connector fixation plate. The installation holes can be holes of a square shape. A connectors(220) is fixed to the installation holes. A plurality of cables(230) is combined in the connector. An upper and lower part of the connectors can be exposed by outside.;COPYRIGHT KIPO 2010