首页> 外国专利> SEMICONDUCTOR DEVICE WHICH INCLUDES A VERTICAL CHANNEL TRANSISTOR, CAPABLE OF PREVENTING THE DEGRADATION OF A TRANSISTOR PROPERTY, AND A MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE WHICH INCLUDES A VERTICAL CHANNEL TRANSISTOR, CAPABLE OF PREVENTING THE DEGRADATION OF A TRANSISTOR PROPERTY, AND A MANUFACTURING METHOD THEREOF

机译:包括垂直通道晶体管,能够防止晶体管性能劣化的半导体装置及其制造方法

摘要

PURPOSE: A semiconductor device and a manufacturing method thereof are provided to reduce the resistance of a bit line by forming impurity region for a bit line to the lower part of a semiconductor pillar.;CONSTITUTION: A semiconductor substrate(20) including a semiconductor pillar(200) is provided. A hard mask pattern(21) is formed on the semiconductor substrate. A surrounding gate electrode which surrounds the semiconductor pillar is formed. Impurity region(25) for a bit line is formed by doping impurity inside the semiconductor substrate. An element isolation trench is formed by etching the semiconductor substrate, where the impurity region for a bit line is formed, into a predetermined depth.;COPYRIGHT KIPO 2010
机译:目的:提供一种半导体器件及其制造方法,以通过在半导体柱的下部形成用于位线的杂质区来减小位线的电阻。构成:包括半导体柱的半导体衬底(20)提供了(200)。在半导体衬底上形成硬掩模图案(21)。形成包围半导体柱的包围栅电极。通过在半导体衬底内部掺杂杂质来形成用于位线的杂质区域(25)。通过将形成有位线的杂质区域的半导体基板蚀刻至预定深度,从而形成元件隔离沟槽。COPYRIGHTKIPO 2010

著录项

  • 公开/公告号KR20100077565A

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20080135535

  • 发明设计人 OH SEUNG CHUL;

    申请日2008-12-29

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:20

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