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SEMICONDUCTOR DEVICE MANUFACTURING METHOD HAVING A RECESS CHANNEL MOS TRANSISTOR, CAPABLE OF FORMING A STABLE AND RELIABLE RECESS CHANNEL MOS TRANSISTOR

机译:具有近沟道MOS晶体管的半导体器件制造方法,能够形成稳定可靠的近沟道MOS晶体管

摘要

PURPOSE: A semiconductor device manufacturing method is provided to prevent a silicon residual, or silicon walls from remaining in the edge part of a gate trench which is contacted with an element isolation region.;CONSTITUTION: A semiconductor device manufacturing method forms an element isolation region confining an activated region. A mask pattern has an opening crossing the activated region. The mask pattern(10) includes an oxide film having an insulation property. A back-up gate trench(15) is formed by etching an exposed activated region with the opening. Semiconductor walls remains in the side walls of the back-up gate trench, which face each other with being contacted with the element isolation region.;COPYRIGHT KIPO 2011
机译:目的:提供一种半导体器件制造方法,以防止硅残留或硅壁残留在与元件隔离区相接触的栅极沟槽的边缘部分。;构成:一种半导体器件制造方法形成元件隔离区限制激活区域。掩模图案具有与激活区域交叉的开口。掩模图案(10)包括具有绝缘特性的氧化膜。通过用开口蚀刻暴露的激活区域来形成后备栅极沟槽(15)。半导体壁保留在后备栅极沟槽的侧壁中,该侧壁彼此面对并与元件隔离区域接触。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100111162A

    专利类型

  • 公开/公告日2010-10-14

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20090029586

  • 发明设计人 CHOI BO WO;HWANG IN SEOK;LEE KEUM JOO;

    申请日2009-04-06

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:47

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