首页> 外国专利> A process for the preparation of a flash memory component - and - flash memory device

A process for the preparation of a flash memory component - and - flash memory device

机译:一种准备闪存组件的方法以及一种闪存设备

摘要

A process for the preparation of a flash memory device, wherein the method comprises:a semiconductor substrate (10), is made available, on which a connection oxide layer (11) in a cells region is formed, a lower voltage gate oxide layer (11b) in a lower voltage field is formed, and a high voltage gate oxide layer (11c) is formed in a high-voltage field;Forming a first polycrystalline silicon layer (12) in the lower - and high voltage fields;Deposition of a connection nitride layer (13) on the overall structure including the first polycrystalline silicon layer (12);Forming a first trench by means of a partial structure of the connection nitride layer (13), the connection of oxide layer (11) and of the semiconductor substrate (10) in the cells region;Form the second and third trenches by means of a partial structure of the connection nitride layer (13), the connection of oxide layer (11) and of the semiconductor substrate (10) in the lower voltage fields and high voltage fields;Forming a field insulation layer (14), in order to fill the first to third trenches;Removal of the connection nitride layer (13);Forming a tunnel insulation layer (15) on the overall structure;Forming a floating gate (16a) by depositing and patterning..
机译:一种制备闪存器件的方法,其中该方法包括:使半导体衬底(10)可用,在其上形成单元区域中的连接氧化物层(11),较低电压栅极氧化物层(10)。在低电压场中形成11b),并在高电压场中形成高电压栅氧化层(11c);在低和高电压场中形成第一多晶硅层(12);在包括第一多晶硅层(12)的整个结构上的连接氮化物层(13);借助于连接氮化物层(13),氧化物层(11)和氮化物层的连接的部分结构形成第一沟槽在单元区域中的半导体衬底(10);借助于连接氮化物层(13)的局部结构,在下部的氧化物层(11)和半导体衬底(10)的连接形成第二和第三沟槽电压场和高压场;形成场绝缘层(14),以填充第一至第三沟槽;去除连接氮化物层(13);在整个结构上形成隧道绝缘层(15);通过沉积和形成浮栅(16a)图案

著录项

  • 公开/公告号DE102005021190B4

    专利类型

  • 公开/公告日2010-01-28

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20051021190

  • 发明设计人

    申请日2005-05-03

  • 分类号H01L21/8247;H01L27/115;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号