首页> 外国专利> METHOD OF MANUFACTURING SPLIT GATE NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND SPLIT GATE NONVOLATILE SEMICONDUCTOR STORAGE DEVICE

METHOD OF MANUFACTURING SPLIT GATE NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND SPLIT GATE NONVOLATILE SEMICONDUCTOR STORAGE DEVICE

机译:分闸非易失性半导体存储装置的制造方法以及分闸非易失性半导体存储装置

摘要

PROBLEM TO BE SOLVED: To decrease the number of processes of manufacturing a split gate nonvolatile storage device.;SOLUTION: The split gate nonvolatile storage device includes: a substrate (2); a floating gate (5) formed on the substrate (2) via a gate insulating film (7); a control gate (6) formed by the floating gate (5) via a tunnel insulating film (8); a first source/drain diffusion layer (4) formed on the substrate (2) on the side of the control gate (6); a second source/drain diffusion layer (3) formed on the substrate (2) on the side of the floating gate (5); a channel region provided to the substrate between the first source/drain diffusion layer (4) and second source/drain diffusion layer (3); and a silicide (21) in contact with the second source/drain diffusion layer (3).;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:减少制造分栅非易失性存储器件的工艺数量。解决方案:分栅非易失性存储器件包括:衬底(2);经由栅极绝缘膜(7)形成在基板(2)上的浮栅(5);由浮置栅极(5)隔着隧道绝缘膜(8)形成的控制栅极(6)。在控制栅(6)一侧的衬底(2)上形成第一源/漏扩散层(4);第二源/漏扩散层(3)形成在浮栅(5)一侧的衬底(2)上;在第一源极/漏极扩散层(4)和第二源极/漏极扩散层(3)之间提供给基板的沟道区;硅化物(21)与第二源/漏扩散层(3)接触。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011049463A

    专利类型

  • 公开/公告日2011-03-10

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORP;

    申请/专利号JP20090198311

  • 发明设计人 ISHIGURO HISASHI;

    申请日2009-08-28

  • 分类号H01L27/115;H01L21/8247;H01L29/792;H01L29/788;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号