首页> 外国专利> Split-gate type nonvolatile memory device, semiconductor device having split-type nonvolatile memory device embedded therein, and methods of forming the same

Split-gate type nonvolatile memory device, semiconductor device having split-type nonvolatile memory device embedded therein, and methods of forming the same

机译:分裂栅型非易失性存储器件,具有嵌入其中的分裂型非易失性存储器件的半导体器件及其形成方法

摘要

A split-gate type nonvolatile memory device includes a semiconductor substrate having a first conductivity type, a deep well having a second conductivity type in the semiconductor substrate, a pocket well having the first conductivity type in the deep well, a source line region having the second conductivity type in the pocket well, an erase gate on the source line region, and a first floating gate and a first control gate stacked sequentially on the pocket well on a side of the erase gate. The pocket well is electrically isolated from the substrate by the deep well, so that a negative voltage applied to the pocket well may not adversely affect operation of other devices formed on the substrate.
机译:分离栅型非易失性存储器件包括:具有第一导电类型的半导体衬底;在半导体衬底中具有第二导电类型的深阱;在深阱中具有第一导电类型的口袋阱;具有第一导电类型的源极线区域。袋型阱中的第二导电类型,在源极线区域上的擦除栅极,以及在擦除栅极的侧面上的袋型阱中顺序堆叠的第一浮置栅极和第一控制栅极。口袋阱通过深阱与衬底电隔离,从而施加到口袋阱的负电压可能不会不利地影响在衬底上形成的其他器件的操作。

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