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Metallic bump structure without under bump metallurgy and manufacturing method thereof

机译:无凸块下冶金的金属凸块结构及其制造方法

摘要

The metallic bump is directly formed on a semiconductor wafer's I/O pad without UBM. First, a zinc layer is formed on the I/O pad or an anti-oxidation layer of the I/O pad is selectively etched off. Then, an isolative layer and a copper foil are arranged sequentially in this order above the I/O pad. The isolative layer is originally in a liquid state or in a temporarily solid state and later permanently solidified. Then, a via above the I/O pad is formed by removing part of the isolative layer and the cooper foil. Subsequently, A thin metallic layer connecting the copper foil and the I/O pad is formed in the via and a plating resist on the copper foil is formed. Then, a metallic bump is formed from the via whose height is controlled by the plating resist. Finally, the plating resist and the copper foil are removed.
机译:金属凸块直接形成在半导体晶圆的I / O焊盘上,而无需UBM。首先,在I / O焊盘上形成锌层,或者选择性地蚀刻掉I / O焊盘的抗氧化层。然后,将隔离层和铜箔以此顺序依次布置在I / O焊盘上方。隔离层最初处于液态或暂时处于固态,然后永久固化。然后,通过去除部分隔离层和铜箔形成I / O焊盘上方的通孔。随后,在通孔中形成连接铜箔和I / O焊盘的薄金属层,并在铜箔上形成抗镀层。然后,由通孔形成金属凸块,该通孔的高度由电镀抗蚀剂控制。最后,去除抗镀层和铜箔。

著录项

  • 公开/公告号US7968446B2

    专利类型

  • 公开/公告日2011-06-28

    原文格式PDF

  • 申请/专利权人 WAN-LING YU;

    申请/专利号US20080246486

  • 发明设计人 WAN-LING YU;

    申请日2008-10-06

  • 分类号H01L21/44;

  • 国家 US

  • 入库时间 2022-08-21 18:09:22

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