A method and system for modeling uncertainties in integrated circuits, systems and fabrication processes may include defining interval values for each uncertain component or parameter in a circuit or system. The method may also include replacing scalar operations with interval operations in an algorithm and discontinuing interval operations in the algorithm in response to a predetermined condition. The method may also include generating a plurality of scalar samples from a plurality of intervals and determine a distribution of each uncertain component or parameter from the scalar samples of the intervals.
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