首页>
外国专利>
Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits
Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits
展开▼
机译:利用多个测试位流来避免局部缺陷的可编程集成电路中的局部缺陷
展开▼
页面导航
摘要
著录项
相似文献
摘要
Methods and structures utilizing multiple configuration bitstreams to program integrated circuits (ICs) such as programmable logic devices, thereby enabling the utilization of partially defective ICs. A user design is implemented two or more times, preferably utilizing different programmable resources as much as possible in each configuration bitstream. The resulting user configuration bitstreams are stored along with associated test bitstreams in a memory device, e.g., a programmable read-only memory (PROM). Under the control of a configuration control circuit or device, the test bitstreams are loaded into a partially defective IC and tested using an automated testing procedure. When a test bitstream is found that enables the associated user design to function correctly in the programmed IC, i.e., that avoids the defective programmable resources in the IC, the associated user bitstream is loaded into the IC, the configuration procedure terminates, and the programmed IC begins to function according to the user design.
展开▼