semiconductor chip test pins and sockets for semiconductor chip test , including him

摘要

present invention is to test for the semiconductor chip and pin him , including semiconductor chip test socket on about that , and more specifically, Advantageously the movement approaching the semiconductor chip to improve the test reliability of the contact is certainly yirueojyeoseo natural test terminal , the wear that occurs when the contact terminals of the semiconductor chip is less in the other contact terminals of the contact terminal as well as during wear on the one side and reduce the cost because you can flip , breakage of parts can be reduced while part relates to a semiconductor chip test socket for the pin can be prevented , and a semiconductor chip including test him . ;