首页> 外国专利> Chromeless phase shift mask for photomask blank, chromeless phase shift mask, and a chromeless phase shift mask production process for

Chromeless phase shift mask for photomask blank, chromeless phase shift mask, and a chromeless phase shift mask production process for

机译:用于光掩模坯料的无铬相移掩模,无铬相移掩模和用于制造无铬相移掩模的工艺

摘要

PROBLEM TO BE SOLVED: To provide a chromeless phase shift mask that can significantly improve CD (Critical Dimension) performance, and to provide a method for manufacturing the mask.;SOLUTION: The chromeless phase shift mask has an engraved portion in a substrate transparent to exposure light so as to control phases of transmitted light, and is characterized in that a light shielding film provided in a portion adjacent to the engraved portion of the substrate or in a peripheral portion of the substrate includes a film (A) made of a material which can be etched in an etching process using an etching gas essentially comprising a fluorine-based gas.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种可大大改善CD(临界尺寸)性能的无色移相掩模,并提供一种制造该掩模的方法。;解决方案:该无色移相掩模在透明且透明的基板上具有雕刻部分。曝光光以控制透射光的相位,其特征在于,设置在与基板的雕刻部分相邻的部分或基板的周边部分中的遮光膜包括由材料制成的膜(A)。可以在蚀刻工艺中使用基本上包含氟基气体的蚀刻气体进行蚀刻。;版权所有:(C)2007,JPO&INPIT

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