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Method for manufacturing SIMOX wafer and SIMOX wafer

机译:SIMOX晶片的制造方法及simox晶片

摘要

This method for manufacturing a SIMOX wafer includes: forming a mask layer on one surface side of a silicon single crystal wafer, which has an opening on a region where a BOX layer is to be formed; implanting oxygen ions through the opening of the mask layer into the silicon single crystal wafer to a predetermined depth, and locally forming an oxygen implantation region; annealing the silicon single crystal wafer with the mask layer, and oxidizing the oxygen implantation region so as to form the BOX layer; and removing a coated oxide film that covers the whole silicon single crystal wafer which is formed in the annealing of the silicon single crystal wafer, wherein the mask layer has a lamination comprising an oxide film and either one or both of a polysilicon film and an amorphous silicon film.
机译:该SIMOX晶片的制造方法包括:在硅单晶晶片的一个表面侧上形成掩模层,该掩模层在将要形成BOX层的区域上具有开口;以及通过掩模层的开口将氧离子注入到硅单晶晶片中至预定深度,并局部形成氧注入区;对具有掩模层的单晶硅晶片进行退火,并氧化氧注入区以形成BOX层;去除覆盖在硅单晶晶片的退火中形成的整个硅单晶晶片的涂覆的氧化膜,其中所述掩模层具有包括氧化膜以及多晶硅膜和非晶硅中的一者或两者的叠层。硅膜。

著录项

  • 公开/公告号US8222124B2

    专利类型

  • 公开/公告日2012-07-17

    原文格式PDF

  • 申请/专利权人 TETSUYA NAKAI;

    申请/专利号US20100822323

  • 发明设计人 TETSUYA NAKAI;

    申请日2010-06-24

  • 分类号H01L21/266;H01L21/426;

  • 国家 US

  • 入库时间 2022-08-21 17:30:33

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