首页> 外国专利> study of silicon thin film photovoltaic devices for application testing

study of silicon thin film photovoltaic devices for application testing

机译:应用测试的硅薄膜光伏器件的研究

摘要

the present invention relates to processes for online filing of efficient metal layers of semiconductor. more specifically, the present invention relates to processes for the pyrolytic deposition in deposition of metal layers of semiconductor of p-type, n-type, and type i in the process of production of float glass.in addition, the present invention relates to processes for pyrolytic deposit online for the production of metal layers of semiconductor of p-type (i -) n - (1 -) p junction, single, double, triple and multiple.these metal layers of semiconductor of p-type, n-type and i are useful in photovoltaic industry and attractive to manufacturers of photovoltaic modules as "value added.
机译:本发明涉及用于在线归档半导体的有效金属层的方法。更具体地,本发明涉及在浮法玻璃的生产过程中在p型,n型和i型半导体的金属层的沉积中的热解沉积的方法。另外,本发明涉及方法。用于在线热解沉积,以生产单,双,三和多p型(i-)n-(1--)p结半导体金属层。这些p型,n型半导体金属层我在光伏行业很有用,并且因为“增值”而对光伏组件制造商有吸引力。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号