首页> 外国专利> SILICON CARBIDE SUBSTRATE FABRICATION METHOD, SEMICONDUCTOR DEVICE FABRICATION METHOD, SILICON CARBIDE SUBSTRATE, AND SEMICONDUCTOR DEVICE

SILICON CARBIDE SUBSTRATE FABRICATION METHOD, SEMICONDUCTOR DEVICE FABRICATION METHOD, SILICON CARBIDE SUBSTRATE, AND SEMICONDUCTOR DEVICE

机译:碳化硅衬底制造方法,半导体器件制造方法,碳化硅衬底和半导体器件

摘要

Disclosed is a process for producing a silicon carbide substrate, which enables the reduction in cost for the production of a semiconductor device using the silicon carbide substrate. The process comprises the steps of: providing a SiC substrate (20) comprising single crystalline silicon carbide; placing the SiC substrate (20) in a container (70) and placing a base substrate (10) in the container (70) in such a manner that the base substrate (10) faces one main surface (20B) of the SiC substrate (20); and heating the base substrate (10) in the container (70) at a temperature equal to or higher than the sublimation temperature of silicon carbide that constitutes the base substrate (10) to thereby form a base layer (10) comprising silicon carbide in such a manner that the base layer (10) is in contact with one main surface (20B) of the SiC substrate (20). In the step of forming the base layer (10), a silicon generation source (91) comprising a silicon-containing substance, which is different from the SiC substrate (20) or the base substrate (10), is placed in the container (70).
机译:公开了一种制造碳化硅衬底的方法,其能够降低使用碳化硅衬底的半导体器件的制造成本。该方法包括以下步骤:提供包含单晶碳化硅的SiC衬底(20);将SiC衬底(20)放置在容器(70)中,并将基础衬底(10)放置在容器(70)中,使得基础衬底(10)面对SiC衬底的一个主表面(20B)( 20);并在等于或高于构成基底基板(10)的碳化硅的升华温度的温度下加热容器(70)中的基底基板(10),从而在该温度下形成包含碳化硅的基底层(10)。基底层(10)与SiC衬底(20)的一个主表面(20B)接触的方式。在形成基底层(10)的步骤中,将包含与SiC衬底(20)或基底衬底(10)不同的含硅物质的硅产生源(91)放置在容器( 70)。

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