首页> 外国专利> PROCESS FOR PRODUCING SOI SUPER JUNCTION LDMOS STRUCTURE COMPLETELY ELIMINATING EFFECT OF SUBSTRATE ASSISTED DEPLETION

PROCESS FOR PRODUCING SOI SUPER JUNCTION LDMOS STRUCTURE COMPLETELY ELIMINATING EFFECT OF SUBSTRATE ASSISTED DEPLETION

机译:生产SOI超结LDMOS结构的方法完全消除了基体辅助耗尽的影响

摘要

A process for producing a silicon on silicon (SOI) super junction lateral double-diffused MOSFET (LDMOS) structure completely eliminating the effect of substrate assisted depletion comprises the following steps: making a conductive layer (10) under a buried oxide layer (9) by using a bonding process; making the super junction LDMOS structure on the SOI substrate having the conductive layer (10). The detailed production process of the conductive layer (10) comprises: depositing a barrier layer on the first bulk silicon wafer, and then depositing a charge guide layer to obtain the first intermediate structure; thermally oxidating the second bulk silicon wafer to form a silicon oxide layer, and then depositing a barrier layer, and finally depositing a charge guide layer to obtain the second intermediate structure; bonding the first intermediate structure to the second intermediate structure by a metal bonding technique to form the conductive layer (10) under the SOI buried oxide layer (9). The present invention can release charge accumulated at the low interface of the buried oxide layer (9) and eliminate influence of the longitudinal electric field on charge balance of a p/n pillar area, to completely eliminate the effect of substrate assisted depletion and improve the breakdown voltage of device.
机译:完全消除衬底辅助耗尽效应的硅上硅(SOI)超结横向双扩散MOSFET(LDMOS)结构的制造工艺包括以下步骤:在掩埋氧化物层(9)下制作导电层(10)通过使用键合工艺;在具有导电层(10)的SOI衬底上制造超结LDMOS结构。导电层(10)的详细制造工艺包括:在第一块状硅晶片上沉积阻挡层,然后沉积电荷引导层以获得第一中间结构;热氧化第二体硅晶片以形成氧化硅层,然后沉积阻挡层,最后沉积电荷引导层以获得第二中间结构;通过金属结合技术将第一中间结构结合到第二中间结构,以在SOI掩埋氧化物层(9)下面形成导电层(10)。本发明可以释放在掩埋氧化物层(9)的低界面处累积的电荷,并消除了纵向电场对ap / n柱面积的电荷平衡的影响,从而完全消除了衬底辅助耗尽的影响并改善了击穿。设备的电压。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号