DISLOCATION REDUCTION IN NON-POLAR GALLIUM NITRIDE THIN FILMS

摘要

Non-polar (1120) a-plane gallium nitride (GaN) films with planar surfaces are grown on (1102) r-plane sapphire substrates by employing a low temperature nucleation layer as a buffer layer prior to a high temperature growth of the non-polar (1120) a-plane GaN thin films