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METHOD FOR PRESERVING A GALLIUM NITRIDE SUBSTRATE, PRESERVED GALLIUM NITRIDE SUBSTRATE, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREFOR
METHOD FOR PRESERVING A GALLIUM NITRIDE SUBSTRATE, PRESERVED GALLIUM NITRIDE SUBSTRATE, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREFOR
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机译:氮化镓基板的保存方法,氮化镓基板的保存方法,半导体装置及其制造方法
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摘要
A GaN substrate storage method of storing, within an atmosphere in which the oxygen concentration is not greater than 15 vol. % and the water-vapor concentration is not greater than 20 g/m3, a GaN substrate (1) having a planar first principal face (1m), and whose plane orientation in an arbitrary point (P) along the first principal face (1m) and separated 3 mm or more from the outer edge thereof has an off-inclination angle Δα of -10° or more, 10° or less with respect to the plane orientation of an arbitrarily designated crystalline plane (1a) that is inclined 50° or more, 90° or less with respect to a plane (1c), being either the (0001) plane or the (0001) plane, through the arbitrary point. In this way a method of storing GaN substrates whose principal-face plane orientation is other than (0001) or (0001), with which semiconductor devices of favorable properties can be manufactured is made available.
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机译:一种GaN衬底存储方法,其在氧浓度不大于15体积%的气氛中存储。 %且水蒸气浓度不大于20g / m 3的GaN衬底(1)具有平坦的第一主面(1m),并且其平面取向沿着第一主面(1m)在任意点(P)中。 )并且相对于任意倾斜的晶体平面(1a)的平面方向,离其外边缘3mm或更大的偏斜角Δα为-10°或更大,10°或更小相对于通过任意点的(0001)平面或(0001)平面的平面(1c)为90°或更小。以此方式,提供了一种存储主表面平面取向不同于(0001)或(0001)的GaN衬底的方法,利用该方法可以制造具有良好特性的半导体器件。
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