首页> 外国专利> Plasma reactor for changing selectively combination structure of inductive coils according to predetermined etching condition, and etching method using the plasma reactor

Plasma reactor for changing selectively combination structure of inductive coils according to predetermined etching condition, and etching method using the plasma reactor

机译:等离子反应器,用于根据预定蚀刻条件选择性地改变感应线圈的组合结构,以及使用该等离子反应器的蚀刻方法

摘要

plasma to selectively change the geometry of the inductive coil in accordance with the conditions set etch and etch reactor using the same method is disclosed. Etching method using a plasma reactor according to the present invention includes the steps of changing the number or arrangement of the inductive coil which is connected to the, RF power supply source based on the first etching conditions; By applying RF source power to the inductive coil, generating a high density plasma reaction chamber therein; Etching the target object first etching target layer by the high-density plasma; Step of stopping the application of the RF source power to the inductive coil; Step of changing the number or arrangement of the inductive coil which is connected to the, RF power supply source based on the second etching conditions; By applying RF source power to the inductive coil, the reaction chamber generating a low-density plasma therein; Etching the second etching target layer of water to be treated by the low density plasma; And a step of stopping the application of the RF source power to the inductive coil. According to the invention, the uniformity of the process is obtained, the etching process may be performed for different conditions in a row within a reaction chamber.
机译:本发明公开了一种等离子体,以根据设定的条件有选择地改变感应线圈的几何形状,并且使用相同的方法蚀刻反应器。使用根据本发明的等离子体反应器的蚀刻方法包括以下步骤:基于第一蚀刻条件来改变连接到RF电源的感应线圈的数量或布置;通过向感应线圈施加射频源功率,在其中产生高密度等离子体反应室;首先通过高密度等离子体刻蚀目标物。停止向感应线圈施加RF源功率的步骤;根据第二蚀刻条件改变连接到RF电源的感应线圈的数量或布置;通过向感应线圈施加射频源功率,反应室在其中产生低密度等离子体。用低密度等离子体刻蚀待处理水的第二刻蚀目标层;以及停止将RF源功率施加到感应线圈的步骤。根据本发明,获得了工艺的均匀性,可以在反应室内连续地针对不同条件进行蚀刻工艺。

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