首页> 外国专利> PLASMA REACTOR FOR CHANGING SELECTIVELY COMBINATION STRUCTURE OF INDUCTIVE COILS ACCORDING TO PREDETERMINED ETCHING CONDITIONS, AND ETCHING METHOD USING THE PLASMA REACTOR, CAPABLE OF SECURING THE UNIFORMITY OF A PROCESS

PLASMA REACTOR FOR CHANGING SELECTIVELY COMBINATION STRUCTURE OF INDUCTIVE COILS ACCORDING TO PREDETERMINED ETCHING CONDITIONS, AND ETCHING METHOD USING THE PLASMA REACTOR, CAPABLE OF SECURING THE UNIFORMITY OF A PROCESS

机译:等离子反应器,用于根据预定的蚀刻条件改变感应线圈的选择性组合结构,以及使用等离子反应器的蚀刻方法,能够确保过程的均匀性

摘要

PURPOSE: A plasma reactor for changing selectively combination structure of inductive coils according to predetermined etching conditions, and etching method using the plasma reactor are provided to perform etching processes having different conditions consecutively in one reaction chamber. ;CONSTITUTION: A reaction chamber(110) comprises a body(111) and a dielectric window(112). An ICP source power part(120) induces an electric field inside the dielectric window. An RF source power supply unit(121) comprises a matching circuit(124) for matching impedance and an RF source power generator. An inductive coil controller(122) comprises a plurality of switches(S1~S4) and a switch control part(125). The RF source power generator generates the RF source power in response to the source power control signal(CTL11) which is received from the main control unit(140).;COPYRIGHT KIPO 2011
机译:目的:提供一种等离子体反应器,其用于根据预定的蚀刻条件选择性地改变感应线圈的组合结构,以及使用该等离子体反应器的蚀刻方法,以在一个反应​​室中连续地执行具有不同条件的蚀刻工艺。组成:反应室(110)包括主体(111)和介电窗(112)。 ICP源功率部分(120)在电介质窗口内感应出电场。 RF源电源单元(121)包括用于匹配阻抗的匹配电路(124)和RF源电源发生器。感应线圈控制器(122)包括多个开关(S1〜S4)和开关控制部(125)。 RF源功率发生器响应从主控制单元(140)接收到的源功率控制信号(CTL11)生成RF源功率。; COPYRIGHT KIPO 2011

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