首页> 外国专利> DEEP N-WELL GUARD RING AND A 3D INTEGRATED CIRCUIT INCLUDING THE SAME CAPABLE OF REDUCING COUPLING NOISE OF A THROUGH SILICON VIA

DEEP N-WELL GUARD RING AND A 3D INTEGRATED CIRCUIT INCLUDING THE SAME CAPABLE OF REDUCING COUPLING NOISE OF A THROUGH SILICON VIA

机译:深N型井护环和3D集成电路,可通过硅减小相同的耦合噪声

摘要

PURPOSE: A deep N-well guard ring and a 3D integrated circuit including the same are provided to reduce power noise of the 3D integrated circuit due to high frequency signals by connecting the deep N-well guard ring located around the through silicon via to a power source.;CONSTITUTION: An N-well region(550) is formed on one side of a semiconductor chip and is formed around a through silicon via(510). An N type impurity region(540) is formed on the N-well region. A guard ring electrode is formed on the N type impurity region. A depletion region(560) is formed around the N-well region of the semiconductor chip.;COPYRIGHT KIPO 2012
机译:目的:通过将位于硅通孔周围的深N阱保护环连接到硅片上,提供了一个深N阱保护环和包括该深N阱保护环的3D集成电路,以降低由于高频信号导致的3D集成电路的电源噪声。组成:N阱区(550)形成在半导体芯片的一侧,并形成在硅通孔(510)的周围。在N阱区域上形成N型杂质区域(540)。在N型杂质区域上形成保护环电极。在半导体芯片的N阱区域周围形成耗尽区(560)。;COPYRIGHT KIPO 2012

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