首页> 外国专利> METHOD FOR MANUFACTURING A MASK OF A SEMICONDUCTOR DEVICE CAPABLE OF REDUCING USAGE COUNT OF ARF IMMERSION EQUIPMENT

METHOD FOR MANUFACTURING A MASK OF A SEMICONDUCTOR DEVICE CAPABLE OF REDUCING USAGE COUNT OF ARF IMMERSION EQUIPMENT

机译:制造能够减少ARF浸入设备使用次数的半导体设备的掩膜的方法

摘要

PURPOSE: A method for manufacturing a mask of a semiconductor device is provided to improve a DoF margin of a cutting mask by changing a partition mask into a dogbon pattern shape.;CONSTITUTION: A first sensitive film pattern of a dogbon shape is formed. Spacers are formed at the sidewall of the first sensitive film pattern. The spacers comprise a nitride film. A second sensitive film pattern is formed between the spacers. The second sensitive film pattern is a negative sensitive film. The spacers are eliminated. A first pattern is formed by etching the second sensitive film pattern by using a cutting mask as an etching mask. An isolation pattern(270) is formed by etching the first pattern by using a pad mask as the etching mask.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于制造半导体器件的掩模的方法,以通过将分隔掩模改变为a形图案形状来提高切割掩模的DoF裕度。;组成:形成a形的第一敏感膜图案。间隔物形成在第一敏感膜图案的侧壁处。间隔物包括氮化物膜。在间隔物之间​​形成第二敏感膜图案。第二感光膜图案是负感光膜。消除了垫片。通过使用切割掩模作为蚀刻掩模来蚀刻第二敏感膜图案来形成第一图案。通过使用焊盘掩模作为蚀刻掩模来蚀刻第一图案来形成隔离图案(270)。COPYRIGHTKIPO 2012

著录项

  • 公开/公告号KR20120081653A

    专利类型

  • 公开/公告日2012-07-20

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20100124527

  • 发明设计人 PARK JONG CHEON;CHO BYUNG UG;

    申请日2010-12-07

  • 分类号H01L21/027;G03F1/76;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:33

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