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WET ETCHING METHOD OF SILICON WAFER AND WET ETCHING DEVICE

机译:硅晶片的湿法刻蚀方法及湿法刻蚀装置

摘要

PROBLEM TO BE SOLVED: To provide a wet etching method and a wet etching device of a silicon wafer in which a constant etching rate can be maintained by adding only one acid, in view of the fact that a prescribed etching rate can be maintained by maintaining one concentration at a constant level even if the other concentration changes in a certain range.;SOLUTION: When the concentration of hydrofluoric acid for obtaining a prescribed etching amount is a first hydrofluoric acid concentration, and the concentration of nitric acid for obtaining a prescribed etching amount is a first nitric acid concentration, the wet etching method of a silicon wafer includes an etching step for using a chemical having the concentration of nitric acid higher than the first nitric acid concentration and the hydrofluoric acid concentration of the first hydrofluoric acid concentration for etching, and an addition step for adding hydrofluoric acid having a concentration higher than the first hydrofluoric acid concentration to the chemical used in the etching step. The chemical after the addition step is used again for etching.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:考虑到可以通过保持一定的蚀刻速率来维持规定的蚀刻速率这一事实,提供一种硅晶片的湿蚀刻方法和湿蚀刻装置,其中可以通过仅添加一种酸来保持恒定的蚀刻速率。一个浓度即使在其他浓度在一定范围内变化时也保持恒定。;解决方案:当用于获得指定蚀刻量的氢氟酸浓度为第一氢氟酸浓度,并且用于获得指定蚀刻量的硝酸浓度时量是第一硝酸浓度,硅晶片的湿蚀刻方法包括蚀刻步骤,该蚀刻步骤使用硝酸浓度高于第一硝酸浓度的化学药品和第一氢氟酸浓度的氢氟酸浓度进行蚀刻。以及添加步骤,用于添加浓度高于第一氢氟酸的氢氟酸蚀刻步骤中所用化学药品的浓度。添加步骤后的化学物质再次用于蚀刻。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013065614A

    专利类型

  • 公开/公告日2013-04-11

    原文格式PDF

  • 申请/专利权人 PRE-TECH AT:KK;

    申请/专利号JP20110202040

  • 发明设计人 YOSHIKAWA KAZUHIRO;

    申请日2011-09-15

  • 分类号H01L21/306;

  • 国家 JP

  • 入库时间 2022-08-21 17:00:55

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