首页> 外国专利> TRIPLE GATE FinFET AND DOUBLE GATE FinFET HAVING FINS OF DIFFERENT VERTICAL DIMENSION

TRIPLE GATE FinFET AND DOUBLE GATE FinFET HAVING FINS OF DIFFERENT VERTICAL DIMENSION

机译:具有不同垂直尺寸的三栅极FinFET和双栅极FinFET

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor structure including a triple gate FinFET and a double gate FinFET having fins of different vertical dimension, and to provide a manufacturing method of a semiconductor structure.;SOLUTION: An injection chemical species containing germanium is injected into the bottom part 33 of a selected semiconductor fin 13' having vertical dimension desired to be reduced. The bottom part 33 of the selected semiconductor fin 13' having the injection chemical species is subjected to selective etching for a semiconductor material where the injection chemical species does not exist, i.e., the semiconductor material at the upper part 23 of the semiconductor fin, and of other semiconductor fin 13 where the injection chemical species does not exist. Consequently, a FinFET having a complete vertical dimension and a high on current, and a FinFET having a reduced vertical dimension and a low on current are obtained on the same semiconductor substrate. Vertical dimension of a semiconductor fin in a selected FinFET can be adjusted, by adjusting the depth of the injection chemical species.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种半导体结构,该半导体结构包括具有不同垂直尺寸的鳍片的三栅FinFET和双栅FinFET,并提供半导体结构的制造方法。期望减小垂直尺寸的所选半导体鳍13'的底部33。对所选择的具有注入化学物质的半导体鳍片13'的底部33进行选择性蚀刻,以选择不存在注入化学物质的半导体材料,即在半导体鳍片的上部23处的半导体材料,并且不存在注入化学物质的其他半导体鳍片13的一部分。因此,在同一半导体衬底上获得了具有完整的垂直尺寸和高导通电流的FinFET,以及具有减小的垂直尺寸和低导通电流的FinFET。可以通过调节注入化学物质的深度来调节所选FinFET中的半导体鳍的垂直尺寸。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013179343A

    专利类型

  • 公开/公告日2013-09-09

    原文格式PDF

  • 申请/专利权人 INTERNATL BUSINESS MACH CORP IBM;

    申请/专利号JP20130105310

  • 发明设计人 TAN YUE;ZHU HUILONG;

    申请日2013-05-17

  • 分类号H01L21/8244;H01L27/11;H01L21/336;H01L29/78;H01L29/786;H01L21/8238;H01L27/092;

  • 国家 JP

  • 入库时间 2022-08-21 16:59:57

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