首页> 外国专利> INTER-LOW-PERMITTIVITY LAYER INSULATING FILM, AND METHOD FOR FORMING INTER-LOW-PERMITTIVITY LAYER INSULATING FILM

INTER-LOW-PERMITTIVITY LAYER INSULATING FILM, AND METHOD FOR FORMING INTER-LOW-PERMITTIVITY LAYER INSULATING FILM

机译:低介电常数层间绝缘膜及形成低介电常数层间绝缘膜的方法

摘要

A low-permittivity interlayer insulating film of the present invention is formed by a plasma CVD method and includes at least carbon and silicon, wherein a ratio of the carbon to the silicon is 2.5 or more, and relative permittivity is 3.8 or less. Also, a film formation method of a low-permittivity interlayer insulating film of the present invention includes forming a film of an insulating film material that includes at least carbon and silicon by a plasma CVD method, wherein a hydrocarbon is not used as the insulating film material, and a ratio of the carbon to the silicon is 2.5 or more, and relative permittivity is 3.8 or less in the formed low-permittivity interlayer insulating film.
机译:本发明的低介电常数层间绝缘膜通过等离子体CVD法形成,并且至少包括碳和硅,其中碳与硅的比率为2.5以上,并且相对介电常数为3.8以下。另外,本发明的低介电常数的层间绝缘膜的成膜方法包括通过等离子体CVD法形成至少包含碳和硅的绝缘膜材料的膜的方法,其中不使用烃作为绝缘膜。在形成的低介电常数层间绝缘膜中,碳与硅之比为2.5以上,相对介电常数为3.8以下。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号