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Method of fabricating oxide material layer with openings attached to device layers

机译:具有附接到器件层的开口的氧化物材料层的制造方法

摘要

A manufacturing method of a semiconductor structure includes providing a substrate having an upper surface and a bottom surface. First openings are formed in the substrate. An oxidization process is performed to oxidize the substrate having the first openings therein to form an oxide-containing material layer, and the oxide-containing material layer has second openings therein. A conductive material is filled into the second openings to form conductive plugs. A first device layer is formed a first surface of the oxide-containing material layer, and is partially or fully electrically connected to the conductive plugs. A second device layer is formed on a second surface of the oxide-containing material layer, and is partially or fully electrically connected to the conductive plugs.
机译:半导体结构的制造方法包括提供具有上表面和底表面的衬底。在衬底中形成第一开口。进行氧化工艺以氧化其中具有第一开口的基板以形成含氧化物的材料层,并且含氧化物的材料层具有其中的第二开口。将导电材料填充到第二开口中以形成导电塞。第一器件层形成在含氧化物的材料层的第一表面上,并且部分或完全电连接到导电塞。第二器件层形成在含氧化物的材料层的第二表面上,并且部分或完全电连接到导电塞。

著录项

  • 公开/公告号US8309402B2

    专利类型

  • 公开/公告日2012-11-13

    原文格式PDF

  • 申请/专利权人 CHA-HSIN LIN;TZU-KUN KU;

    申请/专利号US201113270199

  • 发明设计人 CHA-HSIN LIN;TZU-KUN KU;

    申请日2011-10-10

  • 分类号H01L21;H01L23/12;

  • 国家 US

  • 入库时间 2022-08-21 16:45:05

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