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Method and apparatus for designing and manufacturing electronic circuits subject to leakage problems caused by temperature variations and/or aging

机译:用于设计和制造经受由温度变化和/或老化引起的泄漏问题的电子电路的方法和设备

摘要

First several possible working points are stored with different mappings to available modules. Each of these working points involves different trade-offs for important criteria related to performance and costs. At the design stage, these trade-off points for the criteria are not calibrated to the actual run-time conditions. Subsequently, based on actual values of the leakage criteria caused by temperature variations and/or ageing at given run-time conditions for (a subset of) the working points, it is possible to calibrate the trade-off curves and use a run-time controller to select the most suited working points afterward for an actual circuit. These active working points are selected to just meet the necessary system requirements on performance, while minimizing any of the important cost parameters.
机译:首先,使用与可用模块的不同映射来存储几个可能的工作点。对于与性能和成本相关的重要标准,每个工作点都涉及不同的权衡。在设计阶段,这些标准的折衷点未针对实际运行时条件进行校准。随后,基于在给定运行时间条件下(一个子集)工作点的温度变化和/或老化导致的泄漏标准的实际值,可以校准折衷曲线并使用运行时间控制器随后为实际电路选择最适合的工作点。选择这些活动的工作点只是为了满足必要的系统性能要求,同时最大程度地减少任何重要的成本参数。

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