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Method and apparatus for designing and manufacturing electronic circuits subject to leakage problems caused by temperature variations and/or ageing
Method and apparatus for designing and manufacturing electronic circuits subject to leakage problems caused by temperature variations and/or ageing
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机译:用于设计和制造经受由温度变化和/或老化引起的泄漏问题的电子电路的方法和设备
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摘要
First several possible working points are stored with different mappings to available modules. Each of these working points involves different trade-offs for important criteria related to performance and costs. At the design stage, these trade-off points for the criteria are not calibrated to the actual run-time conditions. Subsequently, based on actual values of the leakage criteria caused by temperature variations and/or ageing at given run-time conditions for (a subset of) the working points, it is possible to calibrate the trade-off curves and use a run-time controller to select the most suited working points afterward for an actual circuit. These active working points are selected to just meet the necessary system requirements on performance, while minimizing any of the important cost parameters.
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