首页> 外国专利> MASK BLANK SUBSTRATE, MASK BLANK, REFLECTIVE MASK BLANK, TRANSFER MASK, REFLECTIVE MASK, AND METHOD FOR MAKING THESE

MASK BLANK SUBSTRATE, MASK BLANK, REFLECTIVE MASK BLANK, TRANSFER MASK, REFLECTIVE MASK, AND METHOD FOR MAKING THESE

机译:蒙版空白基质,蒙版空白,反射蒙版空白,转移蒙版,反射蒙版及其制作方法

摘要

The purpose of the present invention is to provide a mask blank substrate, mask blank and transfer mask which, during grinding, make it possible to eliminate adverse effects on flatness due to a substrate mark comprising an oblique surface and make it possible to improve flatness, and also to provide a method for making the mask blank substrate, mask blank and transfer mask. A substrate mark (4) comprising an oblique surface is formed in a mask blank substrate (1), the angle of inclination of the substrate mark (4) with respect to a main surface (112) is greater than 45° but less than 90°, and the distance (W1) from the boundary of the substrate mark (4) with the main surface (112) to the outer periphery of the mask blank substrate (1) is less than 1.5 mm.
机译:发明内容本发明的目的是提供一种掩模坯料基板,掩模坯料和转移掩模,它们在研磨期间可以消除由于包括倾斜表面的衬底标记而导致的对平坦度的不利影响,并且可以改善平坦度,还提供一种制造掩模坯料基板,掩模坯料和转移掩模的方法。在掩模坯料基板(1)中形成具有倾斜表面的基板标记(4),该基板标记(4)相对于主表面(112)的倾斜角大于45°但小于90°从基板标记(4)与主表面(112)的边界到掩模坯料基板(1)的外周的距离(W 1 )小于1.5mm 。

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