首页> 外国专利> WAFER LEVEL PACKAGE WITH IMPROVED YIELD AND A MANUFACTURING METHOD THEREOF

WAFER LEVEL PACKAGE WITH IMPROVED YIELD AND A MANUFACTURING METHOD THEREOF

机译:产量提高的晶圆级包装及其制造方法

摘要

PURPOSE: A wafer level package and a manufacturing method thereof are provided to improve thermal and physical reliability by using a carbon nanotube with high elasticity to connect a semiconductor chip to a rewiring.;CONSTITUTION: A semiconductor chip(10) includes one surface(10A) and the other surface(10B) facing one surface. A first insulation member(30) is formed on one surface of the semiconductor chip to expose a carbon nanotube(20). The first insulation member includes a first part(31) and a second part(32). A rewiring(40) is electrically connected to the carbon nanotube. A second insulation member(50) is formed on the first insulation member and the rewiring to partially expose the rewiring. An external connection terminal(60) is mounted on the exposed part of the rewiring.;COPYRIGHT KIPO 2013
机译:目的:提供一种晶圆级封装及其制造方法,以通过使用具有高弹性的碳纳米管将半导体芯片连接至重新布线来提高热和物理可靠性。组成:半导体芯片(10)包含一个表面(10A) ),另一面(10B)面向一个面。第一绝缘构件(30)形成在半导体芯片的一个表面上以暴露碳纳米管(20)。第一绝缘构件包括第一部分(31)和第二部分(32)。重新布线(40)电连接到碳纳米管。第二绝缘构件(50)形成在第一绝缘构件和重布线上以部分地暴露重布线。外部连接端子(60)安装在重新布线的裸露部分上。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130017548A

    专利类型

  • 公开/公告日2013-02-20

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20110080044

  • 发明设计人 BAE HAN JUN;

    申请日2011-08-11

  • 分类号H01L23/48;H01L23/12;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:43

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