AUTOMATIC FAULT-TESTING OF LOGIC BLOCKS USING INTERNAL AT-SPEED LOGIC BIST

摘要

Use the built- in constant-speed logic chips -BIST, interface and logic of the macro to the logic gates of the chip system and method for executing automatic test of block error is presented . Following the initialization of internal storage elements , a set of test signals are generated and processed by the logic block . The output of the logic block and stacked in one of the signature , and compares it with the reference signatures to detect the error . Test using a simple test vector may be executed on the ATE ( automatic test equipment ), or on the actual board comprising the chip to be executed by a field engineer .