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Chemical vapor deposition at atmospheric pressure with saturation control

机译:大气压下化学气相沉积与饱和控制

摘要

It is a method for coating a substrate, at atmospheric pressure, to a temperature below the condensation temperature of a semiconductor material is heated, is disclosed, the method comprising the steps of mixing a mass of hableitermaterial and a heated inert gas stream, of the vaporization of the controlled mass of semiconductor material in the inert gas, in order to produce under saturated fluid mixture, of the steering of the undersaturated fluid mixture to a substrate, wherein the substrate is located essentially in the case of atmospheric pressure, of depositing a layer of semiconductor material on a surface of the substrate, of the extracting not deposited semiconductor material and of the repeating the steps of generating, steering, depositing and extracting in order to minimize an amount not deposited semiconductor material comprises.
机译:公开了一种在大气压力下将衬底涂覆至低于加热半导体材料的冷凝温度的温度的方法,该方法包括以下步骤:将半导体材料的一定量的发条材料和加热的惰性气体流混合。为了产生饱和流体混合物,将惰性气体中半导体材料的受控质量汽化,以将不饱和流体混合物引导至衬底,其中,在大气压的情况下,衬底基本上位于大气压下,沉积在衬底表面上的半导体材料层,提取未沉积的半导体材料以及重复产生,控制,沉积和提取步骤以最小化未沉积半导体材料所包括的量。

著录项

  • 公开/公告号DE112011100610T5

    专利类型

  • 公开/公告日2013-01-31

    原文格式PDF

  • 申请/专利权人 CALYXO GMBH;

    申请/专利号DE201111100610T

  • 发明设计人 KENNETH R. KORMANYOS;NICHOLAS REITER;

    申请日2011-02-18

  • 分类号H01L21/20;

  • 国家 DE

  • 入库时间 2022-08-21 16:22:05

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