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METHOD OF MANUFACTURING GaN THIN FILM AND GaN THIN FILM

机译:GaN薄膜的制造方法及GaN薄膜

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing a GaN thin film on AlxGa1-xN(0.5≤x≤1) not by island-shaped growth, and to provide a GaN thin film.;SOLUTION: By using a metal-organic chemical vapor deposition apparatus, an AlN thin film is grown on a sapphire substrate (step S1). For an AlN thin film thus deposited, rocking curves of a symmetry plane and an asymmetry plane are measured by X-ray diffractometry (step S2). An AlN thin film thus obtained is introduced into the metal-organic chemical vapor deposition apparatus, temperature in the growth chamber is raised to about 1100°C, and thermal cleaning of the surface of the AlN thin film is performed (step S3). Temperature is then decreased to 1060°C, pressure in the growth chamber is set to 200 Torr, and a GaN thin film is grown about 200 nm, by using trimethyl gallium as the Ga material, and using NH3 as the N material.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种不通过岛状生长在Al x Ga 1-x N(0.5≤x≤1)上制造GaN薄膜的方法解决方案:通过使用金属有机化学气相沉积设备,在蓝宝石衬底上生长AlN薄膜(步骤S1)。对于如此沉积的AlN薄膜,通过X射线衍射法测量对称面和非对称面的摇摆曲线(步骤S2)。将由此获得的AlN薄膜引入到金属有机化学气相沉积设备中,将生长室中的温度升高至约1100℃,并且对AlN薄膜的表面进行热清洁(步骤S3)。然后将温度降至1060°C,将生长室中的压力设置为200 Torr,并使用三甲基镓作为Ga材料并使用NH 3 作为N物质。;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014154591A

    专利类型

  • 公开/公告日2014-08-25

    原文格式PDF

  • 申请/专利权人 ASAHI KASEI CORP;

    申请/专利号JP20130020651

  • 发明设计人 IWATANI MOTOAKI;MORISHITA TOMOHIRO;

    申请日2013-02-05

  • 分类号H01L21/205;C30B29/38;C23C16/34;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:43

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