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Production method of GaN thin film templet baseplate, GaN thin film templet baseplate, and GaN thick film monocrystal

机译:GaN薄膜模板基板的制造方法,GaN薄膜模板基板和GaN厚膜单晶

摘要

Although film thickness of the GaN monocrystal accurately production method of the control possible GaN monocrystal, it grows the GaN thick film whose quality is good even with when hydro ride vapor phase growth method is utilized the GaN thin film templet baseplate, and the GaN monocrystal growth device which are suited are offered. Ga which it heats melts at specified temperature (gallium) HCl (hydrogen chloride) blowing GaCl which is formed (chloridation gallium) with, NH which is the hydride gas3 (ammonia) the gas and, reacting on the baseplate, the aforementioned NH3 gas through the nozzle, in the production method of the GaN monocrystal due to the hydro ride vapor phase growth method which forms the GaN thin film, for example the baseplate vicinity (, just 0.7 - 4.0 times that diameter of the baseplate tried to supply the position where it is far) from the baseplate. In addition, NGO whose GaN and grating constant are close as a baseplate, (011) it tried to use the baseplate.
机译:GaN单晶的膜厚可以精确地控制可控制的GaN单晶的制造方法,但是即使采用水力汽相生长法,也可以生长质量良好的GaN厚膜; GaN薄膜模板基板也可以生长GaN单晶。提供合适的设备。加热的Ga在规定温度下熔化(镓)HCl(氯化氢)吹入与形成(氯化镓)的GaCl,作为氢化物气体 3 (氨)的NH并与之反应在GaN单晶的制造方法中,由于形成了GaN薄膜的水力气相生长法(例如基板附近,通过喷嘴通过上述喷嘴产生的NH 3 气体),例如试图提供距底板直径远的位置的底板直径的0.7-4.0倍。此外,GaN和光栅常数接近的NGO作为基板,(011)尝试使用该基板。

著录项

  • 公开/公告号JPWO2008035632A1

    专利类型

  • 公开/公告日2010-01-28

    原文格式PDF

  • 申请/专利权人 日鉱金属株式会社;

    申请/专利号JP20080535337

  • 申请日2007-09-14

  • 分类号C30B29/38;C30B25/16;C23C16/34;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-21 18:56:56

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