首页> 外国专利> The membrane for phase change memory which was formed making use of the sputtering target and the same target for phase change type memory and it consists of the element above

The membrane for phase change memory which was formed making use of the sputtering target and the same target for phase change type memory and it consists of the element above

机译:利用溅射靶和用于相变型存储的相同靶形成的相变存储膜,由上述元素组成

摘要

The present invention provides a sputtering target for a phase change memory and a phase change memory film formed with such a target, and the manufacturing method thereof, characterized in that the sputtering target is composed from elements of not less than a three component system and has as its principal component one or more components selected from stibium, tellurium and selenium, and the compositional deviation in relation to the intended composition is +/-1.0at% or less. This sputtering target for a phase change memory is capable of reducing, as much as possible, impurities that cause the reduction in the number of times rewriting can be conducted as a result of such impurities segregating and condensing in the vicinity of the boundary face of the memory point and non-memory point; in particular, impurity elements that affect the crystallization speed, reducing the compositional deviation of the target in relation to the intended composition, and improving the rewriting properties and crystallization speed of the phase change memory by suppressing the compositional segregation of the target.
机译:本发明提供了一种用于相变存储器的溅射靶和由该靶形成的相变存储膜及其制造方法,其特征在于,所述溅射靶由不少于三组分体系的元素组成并且具有作为其主要成分的一种或多种选自锑,碲和硒的成分,相对于预期组成的组成偏差为+/- 1.0at%或更小。这种相变存储器的溅射靶能够尽可能地减少由于这种杂质在半导体器件的界面附近聚集和凝结而导致进行重写次数减少的杂质。记忆点和非记忆点;特别是,通过抑制靶的组成偏析来影响结晶速度,降低靶的组成偏离所期望的组成,并改善相变存储器的重写性能和结晶速度的杂质元素。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号